Schrödinger Simulation of Hot-Electron Photodetection

Weijia Shao; Cheng Zhang; Xiaofeng Li

Asia Communications and Photonics Conference (ACPC) 2019
OSA Technical Digest (Optica Publishing Group, 2019),
paper M4A.325

Schrödinger Simulation of Hot-Electron Photodetection

Weijia Shao, Cheng Zhang, and Xiaofeng Li

Asia Communications and Photonics Conference 2019

Chengdu China
2–5 November 2019
ISBN: 978-1-943580-70-5

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Joint Poster Session (M4A)

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W. Shao, C. Zhang, and X. Li, "Schrödinger Simulation of Hot-Electron Photodetection," in Asia Communications and Photonics Conference (ACPC) 2019, OSA Technical Digest (Optica Publishing Group, 2019), paper M4A.325.

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Abstract

The hot-electron (HE) dynamic process is investigated when HEs traversing metal-dielectric-metal junction. Schrӧdinger equation is employed to calculate the transmission possibility. It is shown that HE cavity is responsible for the enhanced transmission. © 2019 The Author(s)

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