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Optica Publishing Group
  • Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP)
  • OSA Technical Digest (Optica Publishing Group, 2018),
  • paper JTu4A.35
  • https://doi.org/10.1364/3D.2018.JTu4A.35

Nondestructive Metrology of the Process of Holographic Recording by Ellipsometry

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Abstract

Muller matrix ellipsometry is introduced as a nondestructive method to measure the fabrication process of grating upon holography, with which the exact widths and refractive indices, nanoparticle fractions of bright and dark regions are achieved.

© 2018 The Author(s)

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