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2-cycle Cr:ZnS Laser with Intrinsic Nonlinear Interferometry

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Abstract

We demonstrate a fs laser architecture that enables the direct measurement of the laser’s carrier envelope offset frequency. A multi-Watt source is arranged as a full-repetition-rate polycrystalline Cr:ZnS MOPA and covers 3-octaves (0.4–4.2 µm).

© 2019 The Author(s)

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