Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Wavelength-dependent marking characteristics of AR tellurium trilayers

Not Accessible

Your library or personal account may give you access

Abstract

The design and utilization of multilayer AR structures for optical recording applications have been discussed in detail by Bell and co-workers at RCA. 1–3 Trilayer versions of this type of device, in which a transparent dielectric film separates the recording medium from a reflective metal layer, have been shown to exhibit particularly interesting and useful features.

© 1981 Optical Society of America

PDF Article
More Like This
Single-layer gradient-index AR films deposited by the sol-gel process

S. P. Mukherjee and W. Howard Lowdermilk
WP2 Conference on Lasers and Electro-Optics (CLEO:S&I) 1981

Characteristics of a Simple Spectrophone for Studying Iodine Vapor Absorption of Ar+ Laser Radiation

D. H. Leslie and G. L. Trusty
TuB6 Photoacoustic Spectroscopy (PAS) 1981

Therapeutic applications of Ar-ion and Nd; YAG lasers

J. M. Brunetaud, J. Biserte, J. Charlier, J. L. Lafitte, G. Rotteleur, and P. Vandenbussche
FI2 Conference on Lasers and Electro-Optics (CLEO:S&I) 1981

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.