Abstract

With the advent of picosecond photodetectors, photoconductive switches, and other ultrafast devices, the need has arisen for a measurement system capable of characterizing small electrical signals with picosecond accuracy. Techniques for measuring ultrafast electrical signals to date have limitations to their use. Sampling oscilloscopes have temporal resolutions limited by their electronic sampling window.

© 1982 Optical Society of America

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription