Abstract
The development of very high bit rate electronic systems requires instrumentation to routinely test fast circuits operating at multigigahertz repetition rates. We demonstrate here the first electrooptic sampling system using a mode-locked Injection laser as the source of sampling pulses. This system is compact and measures high repetition rate electrical waveforms with a resolution of 12 ps. It is suitable for noninvasive characterization of high speed circuits based on III—IV materials technology.1
© 1986 Optical Society of America
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