Photoacoustic deformation measurements on sapphire below ablation threshold at 193 nm

R. W. DREYFUS; F. A. McDONALD; R. J. VON GUTFELD

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Conferences > CLEO > 1987 > THK > THK43

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1987),
paper THK43

Photoacoustic deformation measurements on sapphire below ablation threshold at 193 nm

R. W. DREYFUS, F. A. McDONALD, and R. J. VON GUTFELD

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R. W. DREYFUS, F. A. McDONALD, and R. J. VON GUTFELD

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R DREYFUS
F McDONALD
R GUTFELD

Conference on Lasers and Electro-Optics 1987

Baltimore, Maryland United States
26 April–1 May 1987
ISBN: 0-936659-49-1

From the session
Poster Session: 3 (THK)

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R. W. DREYFUS, F. A. McDONALD, and R. J. V. GUTFELD, "Photoacoustic deformation measurements on sapphire below ablation threshold at 193 nm," in Conference on Lasers and Electro-Optics, D. Auston, R. Jacobs, R. Bartolini, and P. Liao, eds., Vol. 14 of OSA Technical Digest (Optica Publishing Group, 1987), paper THK43.

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Conference on Lasers and Electro-Optics 1987
Baltimore, Maryland United States
26 April–1 May 1987
ISBN: 0-936659-49-1
From the session Poster Session: 3 (THK)

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