Optical step frequency reflectometry

K. IIZUKA; Y. IMAI; A. P. FREUNDORFER; R. JAMES; R. WONG; S. FUJII

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1990),
paper CTHP4

Optical step frequency reflectometry

K. IIZUKA, Y. IMAI, A. P. FREUNDORFER, R. JAMES, R. WONG, and S. FUJII

Conference on Lasers and Electro-Optics 1990

Baltimore, Maryland United States
21–25 May 1990
ISBN: 1-55752-131-X

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Detectors and Fiber Sensors (CTHP)

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K. IIZUKA, Y. IMAI, A. P. FREUNDORFER, R. JAMES, R. WONG, and S. FUJII, "Optical step frequency reflectometry," in Conference on Lasers and Electro-Optics, T. Giallorenzi, S. Guch, Jr., A. Johnson, and R. Lind, eds., Vol. 7 of OSA Technical Digest (Optica Publishing Group, 1990), paper CTHP4.

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Abstract

Optical carrier frequency stepped reflectometry capable of improving the resolution 1000 times over that of the previously reported optical frequency domain reflectometer (OFDR)^1,2 is proposed. In the proposed method, optical carrier frequency instead of an AM frequency as in the OFDR is shifted stepwise.³

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