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Shunt Detection and Performance Characterization of Silicon Solar Cells Using Thermoreflectance Imaging

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Abstract

Thermoreflectance is quantitatively compared with lock-in IR thermography for NDE of solar cells. The order of magnitude enhancement in spatial resolution enables shunt detection as well as extraction of local IV curves, diode parameters, and thermal diffusivity and conductivity.

© 2011 Optical Society of America

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