Statistical Properties of Scattering Loss and Mode Splitting in Microdisk Resonators

Qing Li; Ali Asghar Eftekhar; Ali Adibi

doi:10.1364/CLEO_AT.2011.JTuI11

CLEO:2011 - Laser Applications to Photonic Applications
OSA Technical Digest (CD) (Optica Publishing Group, 2011),
paper JTuI11
•https://doi.org/10.1364/CLEO_AT.2011.JTuI11

Statistical Properties of Scattering Loss and Mode Splitting in Microdisk Resonators

Qing Li, Ali Asghar Eftekhar, and Ali Adibi

CLEO: Applications and Technology 2011

Baltimore, Maryland United States
1–6 May 2011
ISBN: 978-1-55752-910-7

From the session
Nanophotonics and Integration Joint Poster Session (JTuI)

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Q. Li, A. A. Eftekhar, and A. Adibi, "Statistical Properties of Scattering Loss and Mode Splitting in Microdisk Resonators," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optica Publishing Group, 2011), paper JTuI11.

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Abstract

We report an experimental observation that in high-Q silicon microdisk resonators, the intrinsic Q and mode splitting can vary significantly over the azimuthal orders. A theoretical roughness model qualitatively explains the observed results.

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