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Multiplexed Two-color Phase-and-amplitude Characterization of Harmonic Up-conversion in OAM Beams using Ptychography

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Abstract

We present high-resolution, simultaneous two-color phase-and-amplitude characterization of 2nd harmonic up-conversion in OAM beams by ptychography. We measure topological charge conservation during 2nd harmonic generation process, which can be extended to high-order harmonic upconversion.

© 2018 The Author(s)

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