Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope

Guan-Yu Zhuo; Zu-Po Yang; Ming-Che Chan

doi:10.1364/CLEO_AT.2018.JTu2A.93

Conference on Lasers and Electro-Optics
OSA Technical Digest (online) (Optica Publishing Group, 2018),
paper JTu2A.93
•https://doi.org/10.1364/CLEO_AT.2018.JTu2A.93

Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope

Guan-Yu Zhuo, Zu-Po Yang, and Ming-Che Chan

CLEO: Applications and Technology 2018

San Jose, California United States
13–18 May 2018
ISBN: 978-1-943580-42-2

From the session
Poster Session I (JTu2A)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
G. Zhuo, Z. Yang, and M. Chan, "Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope," in Conference on Lasers and Electro-Optics, OSA Technical Digest (online) (Optica Publishing Group, 2018), paper JTu2A.93.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.

PDF Article

More Like This

Two-Photon light-sheet microscope with adaptive optics in the illumination and detection path

Dean Wilding and Reto Fiolka
JTu5B.5 3D Image Acquisition and Display: Technology, Perception and Applications (3D) 2018

An MMI-based Tunable Laser for Integrated Photonic Circuits

Ludovic Caro, Mohamad Dernaika, and Frank H. Peters
SW3Q.6 CLEO: Science and Innovations (CLEO:S&I) 2018

Photonic integrated circuits for nanoscopy

Jean-Claude Tinguely, Øystein I. Helle, David A. Coucheron, Firehun T. Dullo, Cristina I. Øie, and Balpreet S. Ahluwalia
IW2B.5 Integrated Photonics Research, Silicon and Nanophotonics (IPR) 2018

Previous Article Next Article