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Conferences > COSI > 2012 > CM2B > CM2B.3

Improved Extended Depth-of-Field Microscopy through PSF Engineering and Robust Processing

Shuai Yuan and Chrysanthe Preza

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Abstract

Performance investigation of improved extended depth-of-field microscopy achieved with point-spread function engineering to reduce image artifacts due to depth-induced aberrations and processing that is robust to system noise.

© 2012 Optical Society of America

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