Abstract

The use of fibre-optical components allows the development of compact devices qualified for numerous industrial applications (telecoms, space, radar, etc..). However, some limitations due to the use of optical fibres are critical in a metrological context. The main limitation is the high sensitivity of the light polarization to environmental conditions as temperature and pressure. The second is the presence of interferences caused by residual reflections at the optical interfaces [1]. We present an original scheme to overcome those limitations while achieving metrological performances.

© 2019 IEEE