Abstract

Main goal of the work was the experimental study of the total X-ray flow intensity and the radiation distribution in the beam passed through the narrow extended slit (Fig. 1) formed by two plane polished quartz reflectors from the slit magnitude width. The investigations are carried out with using of a conventional tube (Cu) in regime U=20 keV, I=10 mA. Slit width is varied in the interval 30÷120000 nm. The direct beam intensity was defined for the comparison with the experimental data obtained for the quartz waveguide (Fig. 2). The comparison shows that the experimental intensity function for air slit waveguides does drastically differ from the slit size dependence of the X-ray direct beam. The intensity of a multiple total reflection beam can not exceed the direct beam one. By this means the upper X-ray beam intensity limit after waveguide in contexts of the direct propagation and the multiple total reflection mechanism can not exceed the treble direct beam intensity. For wide slits (s>3000 nm) the experimental waveguide intensity is near the treble direct beam one. But the slit size area 30≤s≤200 nm is characterized by an abrupt exceeding of the waveguide emergent beam intensity over this parameter of the direct beam. The disparity displayed we explain by the existence of an alternative mechanism for X-ray flow passing through the narrow extended slit – waveguide-resonance propagation. The device with such size slit we call the waveguide-resonator. Our model for the phenomenon intends the arising of the uniform interference field of X-ray standing wave in all space of the waveguide-resonator slit [1] and the attenuating interference field of X-ray standing wave in reflector volumes (Fig. 3).

© 2003 Optical Society of America