A wavelet transform and linear discriminant analysis were applied to spectral traces of materials to improve material fractional abundance estimation by reducing material class sizes and increasing class separations. This approach is demonstrated using a variety of true material traces that were used to generate simulated measurements.

© 2004 Optical Society of America

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription