Abstract
Numerical investigations of scattering loss induced by side -wall roughness are performed for SOI square strip waveguides under quasi -TE and quasi-TM polarizations. Propagation loss is calculated for waveguide sizes ranging from 500nm to 100nm . Simulations show when the incident fundamental mode polarization is a quasi -TM one, lower propagation loss is expected.
© 2004 Optical Society of America
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