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Optica Publishing Group
  • Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper FMN1
  • https://doi.org/10.1364/FIO.2008.FMN1

Characterization of optical PCB interconnects by means of low-coherence interferometry

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Abstract

Low-coherence interferometry has been applied in order to analyze the dispersion behaviour and optical attenuation of highly dense multimode polymeric waveguides realized for PCB interconnects. Additional information about the photolithographic process can be directly deduced from the interferometric patterns.

© 2008 Optical Society of America

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