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  • Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper FThB5
  • https://doi.org/10.1364/FIO.2008.FThB5

Far-field method for the characterization of threedimensional fields

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Abstract

We introduce a polarimetry-based far-field method for the study of the interaction between a three-dimensional focused field and a sub-resolution scatterer in the focal region of a high numerical aperture lens. We show that it is possible to analyze this interaction by measuring the spatially-resolved polarization state of the scattered light across the exit pupil of the detection system. This method may be used to analyze objects with sub-resolution features.

© 2008 Optical Society of America

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