Abstract
Our transmission type four detectors polarimeter (T-FDP) was improved in its measurement speed. The maximum sampling speed of the High-speed T-FDP is increased from 10 ms to 1 μs and its applications are reported. One of the applications is the time-resolved observation of the fast phenomenon such as the liquid crystal alignment. Another application is the polarization detector of the polarimetric interferometer, which is designed for the thickness measurement of the thin films. It could determine the critical thickness of the soap films at the break.
© 2013 Optical Society of America
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