Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > FiO > 2014 > FTh3G > FTh3G.8

High NA Pupil Plane Image Polarimetry for Detection of Surface and Subsurface Damage in Optical Materials

Victor Densmore, Youngsik Kim, Geon-Hee Kim, and Tom D. Milster

Not Accessible

Your library or personal account may give you access

Abstract

A high-NA solid immersion lens microscope in conjunction with polarization modulated pupil plane imaging is investigated as a means for surface and subsurface damage detection in optical materials.

© 2014 Optical Society of America

PDF Article
More Like This
Subsurface Damage Characterization with Nonlinear High Numerical Microscopy

Phat Lu, Youngsik Kim, and Tom D. Milster
JW3A.9 Frontiers in Optics (FiO) 2014

Subsurface Damage in Optical Materials: Origin, Measurement and Removal

P. Paul Hed, David F. Edwards, and Janet B. Davis
WC1 Optical Fabrication and Testing (OF&T) 1988

Evaluation of Subsurface Damage and Surface Roughness by Light Scattering Techniques

Marcus Trost, Sven Schröder, and Angela Duparré
OTh3B.6 Optical Fabrication and Testing (OF&T) 2014

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use