Huygens Dipole for Nanolocalization

Ankan Bag; Martin Neugebauer; Paweł Woźniak; Gerd Leuchs; Peter Banzer

doi:10.1364/FIO.2018.FM3C.6

Frontiers in Optics / Laser Science
OSA Technical Digest (Optica Publishing Group, 2018),
paper FM3C.6
•https://doi.org/10.1364/FIO.2018.FM3C.6

Huygens Dipole for Nanolocalization

Ankan Bag, Martin Neugebauer, Paweł Woźniak, Gerd Leuchs, and Peter Banzer

Frontiers in Optics 2018

Washington, DC United States
16–20 September 2018
ISBN: 978-1-943580-46-0

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Advanced Beam Shaping and Trapping (FM3C)

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A. Bag, M. Neugebauer, P. Woźniak, G. Leuchs, and P. Banzer, "Huygens Dipole for Nanolocalization," in Frontiers in Optics / Laser Science, OSA Technical Digest (Optica Publishing Group, 2018), paper FM3C.6.

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Abstract

We discuss a nanolocalization technique with sub-nanometer localization resolution based on position dependent transverse Kerker scattering, obtained via interference of tailored electric and magnetic dipole moments.

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