Abstract
Fatigue is conventionally described by an empirical constant n that can be related to a flaw growth assumption or to how strength varies with time and stress. Lifetimes can then be predicted by (σsl σ)n = (t/ts), with σs,ts the screen test stress and time. If flaw growth during the screen test is neglected. This expression appears accurate to failure levels of <10-3 in 30 years.1,2 This review will concentrate on evaluation of n for extrinsic flaws (dust, etc ), which are the important flaws for field installation.
© 1982 Optical Society of America
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