Abstract

InP/InGaAs avalanche photodiodes (APDs) hold considerable promise as receivers for long-haul high-bit-rate optical communication systems. There have been a few preliminary reports on their reliability,1,2 but the failure mode and mechanism are not yet clear. We describe the course of surface degradation of InP/InGaAs APDs and propose the failure mechanism involved.

© 1988 Optical Society of America

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