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Full-Speed Testing of Silicon Photonic Electro-Optic Modulators from Picowatt-level Scattered Light

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Abstract

We demonstrate a technique for measuring the full-speed performance of integrated modulators from ultraweak surface-coupled and scattered light. This can enable rapid characterization of unpackaged, high-speed wafer-scale integrated photonics without test ports or special fabrication.

© 2020 The Author(s)

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