Abstract

The poor speed performance or the limited optical accuracy of the scanning devices currently employed in microspectroscopy can be substantially improved, for high resolution work, using a method based on the displacement of the condenser by means of an electrodynamic technique. The unit described, for work in the visible range, features random addressing capability for both X and Y scanning axes and focusing by means of arbitrary driving signals. An area up to 500 × 500 μm2 can be explored with an accuracy of 0.15 μm approximately, while the position settling-time is less than 6 msec. The fast and precise operation is particularly valuable in dual-beam measurements on photosensitive and living samples as well as in more complicated computer assisted experiments.

© 1976 Optical Society of America

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