Abstract

When the noise power spectrum (NPS) of a radiographic screen–film system is measured by microdensitometrically scanning the film with a long narrow slit, sufficient slit length allows estimation of a section of the 2-D NPS from the 1-D film scans; insufficient length causes underestimation of the NPS, particularly at low frequencies (≲1 cycle/mm). Spectra of Hi-Plus, Par Speed, and Detail screens used with XRP films measured as a function of microdensitometer slit length tended to plateau at long slit lengths. The slit length was considered sufficient when NPS components at 0.4 cycle/mm were within 5% of the plateau. This occurred for slit lengths of at least 4.2, 2.6, and 2.5 mm for Hi-Plus, Par Speed, and Detail systems, respectively.

© 1981 Optical Society of America

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