Abstract

By expanding the incident focused beam field in terms of its plane wave spectrum and by using the technique we developed earlier to treat the problem of the scattering of plane waves by arbitrarily shaped dielectric obstacles, we have been successful in solving the problem of the scattering of sharply focused beams by arbitrarily shaped dielectric particles. It was found that the presence of the curvature of the incident wave front and the nonuniformity of the incident wave intensity affect greatly the scattering characteristics.

© 1982 Optical Society of America

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