Abstract

Computer-simulated schlieren pictures are used to interpret and quantitatively analyze schlieren pictures taken from a fast varying plasma with axial symmetry. Structurized angular distributions of deflected rays are obtained from a ray tracing simulation, the characteristics of which are related to density, density gradients, and dimensions of the plasma. Angular distributions are transformed into intensity distributions using the optical data of a typical schlieren system. Ranges of the plasma parameters density, density gradients, and dimensions are given. As an example the method is applied to the compression phase of a fast high voltage plasma focus.

© 1985 Optical Society of America

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