Abstract

We propose a method for determination of the complex refractive index of absorbing materials either in bulk or film geometry by measuring its reflectivity when coated with a well-characterized transparent dielectric at two specific optical thicknesses: n1d1 = λ0/4 and n1d1 = λ0/2. The complex refractive index of the sample ñ = (n, k) is calculated for the monitoring wavelength λ0. The selected optical thicknesses of the coating allow the calculation of its geometrical thickness, therefore the variation of ñ with wavelength in the region where the reflectivity is measured can be determined.

© 1988 Optical Society of America

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