Abstract

An amplitude reflectance diagram is a useful tool for visualizing the relationships between the performance of an optical coating and the optical parameters. This paper gives a brief description of the construction and characterization of the reflectance diagrams for different indices. Then, applications of reflectance diagram-aided techniques to the design of both phase dispersion-induced narrow reflection and transmission filters, as well as to the optical monitoring of the symmetric multilayers of types (A2BA) and (AB2CBA), are illustrated. Some experimental results of phase dispersion-induced narrowband filters are reported.

© 1989 Optical Society of America

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