Abstract

In all spectroscopic methods, there exists an integral equation relating the observed spectrum and the intensity distribution observed by the spectroscopic instrument. An improved spectrum can be reconstructed by solving this integral equation. A process of eigenvalue analysis based on the theory of Hilbert and Schmidt was developed and applied to solve the equation. Formulation of this method and some computer simulations are presented on the results from a Fabry-Perot interferometer, a diffraction grating, and a two-beam interferometer. We also apply this method to spectroscopic techniques and considerations of resolution.

© 1989 Optical Society of America

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