Abstract

A new method is proposed for microscopic observation of the thickness distribution across the thick (greater than about 12 μ) transparent film. The quality of an observation is analyzed by expressing the resolution error, image intensity, and depth of focus in terms of the refractive index and geometrical constants of the thickness distribution. Constraints are derived governing design of the viewing system by algebraically demanding that the resolution error be sufficiently small, and the image intensity and focal depth be sufficiently large. The constraints upon system parameters seem to be physically realizable.

© 1964 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Electron microscopic investigations of cross sections of optical thin films

K. H. Guenther and H. K. Pulker
Appl. Opt. 15(12) 2992-2997 (1976)

Absolute absorption cross-section measurement of a submonolayer film on a silica microresonator

Jack A. Barnes, Gianluca Gagliardi, and Hans-Peter Loock
Optica 1(2) 75-83 (2014)

Leakage radiation microscope for observation of non-transparent samples

Juan M. Merlo, Fan Ye, Michael J. Burns, and Michael J. Naughton
Opt. Express 22(19) 22895-22904 (2014)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (2)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (11)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription