Abstract

A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co–Pd samples. The composition dependencies of the dielectric tensor for both Co–Pt and Co–Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.

© 1992 Optical Society of America

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