Abstract

Second-harmonic generation in a uniaxial crystal in total-reflection geometry is precisely measured. A Y-cut plate and a Z-cut plate of quartz crystals were used as samples. The incident wave is totally reflected by a glass prism in contact with the sample crystal, and an evanescent wave penetrates into the sample as a fundamental wave. The results gave the quantitative values of the components for a nonlinear optical susceptibility tensor with various polarizations and with Y-cut and Z-cut quartz plates. This technique can be applied to various samples to evaluate their nonlinear optical efficiencies.

© 1994 Optical Society of America

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