Abstract

We present a simple method to determine precisely the specular reflectance of optical components. The absence of transmissive elements in this method makes a wide spectral range available. High accuracy and precision are achieved with a fast, periodic change between the reference beam and the probe beam. Special efforts were made to eliminate inhomogeneities of beam intensity and detector sensitivity. With our experimental setup we obtain a precision of ±3 × 10−4 at the wavelength of 10.6 μm and ±3 × 10−5 at 1.06 μm for a single-bounce-measuring setup.

© 1994 Optical Society of America

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