Determination of absolute emission cross sections for electron-impact-induced line radiation in the vacuum ultraviolet

Contributions to the Relative Uncertainty ( $\sqrt{3}\sigma$ Level) of the Spectral Responsivity $\overline{s(\lambda )}$ of the Spectrometer–Detector System at λ = 91.98 nm Used for the Photoemission Cross-Section Measurements

Contributions to the Relative Uncertainty ( $\sqrt{3}\sigma$ Level) of the Photoemission Cross Section σ(λ = 91.98 nm) for the Ar II 3s3p^{6 2}S_1/2–3s²3p^{5 2}P_1/2 Transition at 2-keV Excitation Energy

Parameters of Apertures 1–4 and the Faraday Cup (FC) Used to Monitor the Alignment and Focusing of the Exciting Electron-Beam (2-keV Excitation Energy)

Note: ϕ_n, diameter; l_n, distance from the center of the target chamber; U_n, bias voltage applied to reduce the production of secondary electrons; i_n, typical current measured at apertures 1–4 and FC.

Table 1

Contributions to the Relative Uncertainty ( $\sqrt{3}\sigma$ Level) of the Spectral Responsivity $\overline{s(\lambda )}$ of the Spectrometer–Detector System at λ = 91.98 nm Used for the Photoemission Cross-Section Measurements

Table 2

Contributions to the Relative Uncertainty ( $\sqrt{3}\sigma$ Level) of the Photoemission Cross Section σ(λ = 91.98 nm) for the Ar II 3s3p^{6 2}S_1/2–3s²3p^{5 2}P_1/2 Transition at 2-keV Excitation Energy

Table 3

Parameters of Apertures 1–4 and the Faraday Cup (FC) Used to Monitor the Alignment and Focusing of the Exciting Electron-Beam (2-keV Excitation Energy)

Note: ϕ_n, diameter; l_n, distance from the center of the target chamber; U_n, bias voltage applied to reduce the production of secondary electrons; i_n, typical current measured at apertures 1–4 and FC.