Abstract

The exact determination of the modulation transfer function (MTF) of a physical system is a persistent problem. We present a practical method of measuring numerically the MTF of linear solid-state x-ray-sensitive detectors. The method is based on the use of edge techniques and allows us to obtain the MTF of a linear detector from its edge-spread function (ESF). ESF measurement techniques are discussed in detail, and calculation of the corresponding MTF’s are shown.

© 1995 Optical Society of America

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