Abstract

Dipping-induced in-plane anisotropy in organic molecular films is characterized by use of second-harmonic generation (SHG) measurement and analyzed by use of a new perturbation method. We derived theoretical formulas for the dependence of SHG intensity on the polarizations of an incident fundamental beam, an output second-harmonic beam, and an azimuthal angle of samples, which agreed well with our experimental measurements.

© 2000 Optical Society of America

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