Abstract

Optical wave propagation in neodymium-doped yttrium oxide (Nd:Y2O3) films grown on R-plane sapphire substrates by molecular beam epitaxy has been studied by the prism coupler method. The measurements yield propagation loss data, the refractive index, and the dispersion relation. The refractive index of the Nd:Y2O3 at 632.8nm is found to be 1.909, and the lowest propagation loss measured is 0.9±0.2cm1 at 1046nm with a polymethyl methacrylate top cladding layer on a film with 6nm root mean square surface roughness. The loss measurements suggest that the majority loss of this planar waveguide sample is scatter from surface roughness that can be described by the model of Payne and Lacey [Opt. Quantum Electron. 26, 977 (1994)].

© 2010 Optical Society of America

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