Abstract

This study proposed to generate digital sampling Moiré fringes by two-pixel down-sampling as a substitute for microscope scanning Moiré fringes, and further reconstruct multiplication Moiré fringes for micron/nano-scale deformation measurement. The displacement and strain sensitivities of the proposed reconstructed multiplication Moiré method are 2 times higher in a wide field of view. Besides, two-dimensional deformation is easily measurable without rotating the sample stage or the scanning lines, no matter whether the scanning resolution is adjustable or not. As an example, the deformations of a carbon fiber reinforced plastic specimen were measured and analyzed. The proposed method effectively expands the application range of the Moiré technique to deformation measurement.

© 2016 Optical Society of America

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