Abstract

For unpolarized or circularly polarized light incident at a dielectric-conductor interface, the intensity reflectance Ru(ϕ) can be made an essentially linear function of the angle of incidence ϕ over a significant range of ϕ at specific values of the normal-incidence intensity reflectance R0 (1/3) and the associated normal-incidence reflection phase shift δ0 (40°). This places the complex refractive index njk of the interface in the domain of fractional optical constants. As demonstrated by specific examples, this is realizable in external reflection at vacuum–metal interfaces in the UV, and in internal reflection in the IR at interfaces between a transparent high-index substrate and an optically opaque thin film of the proper n and k. Fractional optical constants are also achievable for light reflection in air at planar surfaces of appropriately designed, nanostructured, metamaterial substrates.

© 2017 Optical Society of America

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