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OSA Publishing

1 July 1995, Volume 34, Issue 19, pp. 3565-3837   37 articles

First-order parameters for a general two-beam interferometer

Appl. Opt. 34(19), 3571-3575 (1995)  View: HTML | PDF

Quantitative comparison of background rejection, signal-to-noise ratio, and resolution in confocal and full-field laser scanning microscopes

Appl. Opt. 34(19), 3576-3588 (1995)  View: HTML | PDF

Photosensitive element for an infrared-to-visible image converter

Appl. Opt. 34(19), 3589-3594 (1995)  View: HTML | PDF

Design for polarizing holographic optical elements

Appl. Opt. 34(19), 3595-3602 (1995)  View: HTML | PDF

Application of laser, holographic, nondestructive testing by impact loading

Appl. Opt. 34(19), 3603-3606 (1995)  View: HTML | PDF

Computer holographic lens

Appl. Opt. 34(19), 3607-3609 (1995)  View: HTML | PDF

Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry

Appl. Opt. 34(19), 3610-3619 (1995)  View: HTML | PDF

Wedge-plate shearing interferometers for collimation testing: use of a moiré technique

Appl. Opt. 34(19), 3628-3638 (1995)  View: HTML | PDF

Fizeau phase-measuring interferometry using the moiré effect

Appl. Opt. 34(19), 3639-3643 (1995)  View: HTML | PDF

Topometry of technical and biological objects by fringe projection

Appl. Opt. 34(19), 3644-3650 (1995)  View: HTML | PDF

Silicon-gap Fabry–Perot filter for far-infrared wavelengths

Appl. Opt. 34(19), 3651-3657 (1995)  View: HTML | PDF

Adjustable half-wave plate

Appl. Opt. 34(19), 3658-3661 (1995)  View: HTML | PDF

Simple method to fabricate a polarizer with a large aperture by the use of anodic alumina films

Appl. Opt. 34(19), 3662-3667 (1995)  View: HTML | PDF

Calcite/barium fluoride ultraviolet polarizing prism

Appl. Opt. 34(19), 3668-3670 (1995)  View: HTML | PDF

Determination of absolute emission cross sections for electron-impact-induced line radiation in the vacuum ultraviolet

Appl. Opt. 34(19), 3671-3680 (1995)  View: HTML | PDF

Sky-radiance gradient measurements at narrow bands in the visible

Appl. Opt. 34(19), 3681-3685 (1995)  View: HTML | PDF

High-accuracy spectrometer for measurement of regular spectral transmittance

Appl. Opt. 34(19), 3686-3692 (1995)  View: HTML | PDF

Optical properties of semiconductor-metal composite thin films in the infrared region

Appl. Opt. 34(19), 3702-3710 (1995)  View: HTML | PDF

Rugate absorbing thin films and the 2 × 2 inhomogeneous matrix

Appl. Opt. 34(19), 3711-3714 (1995)  View: HTML | PDF

Molybdenum/beryllium multilayer mirrors for normal incidence in the extreme ultraviolet

Appl. Opt. 34(19), 3727-3730 (1995)  View: HTML | PDF

Measurement of the concentrations of solutions through chromatic systems

Appl. Opt. 34(19), 3731-3736 (1995)  View: HTML | PDF

Atomic force microscopy silicon tips as photon tunneling sensors: a resonant evanescent coupling experiment

Appl. Opt. 34(19), 3737-3742 (1995)  View: HTML | PDF

Slurry particle size evolution during the polishing of optical glass

Appl. Opt. 34(19), 3743-3755 (1995)  View: HTML | PDF

Liquid crystal-on-silicon implementation of the partial pixel three-dimensional display architecture

Appl. Opt. 34(19), 3756-3763 (1995)  View: HTML | PDF

Link design for nondirected wireless infrared communications

Appl. Opt. 34(19), 3764-3776 (1995)  View: HTML | PDF

Evanescent-wave scattering by electrophoretic microparticles: a mechanism for optical switching

Appl. Opt. 34(19), 3777-3785 (1995)  View: HTML | PDF

Analysis of input-grating couplers having finite lengths

Appl. Opt. 34(19), 3786-3792 (1995)  View: HTML | PDF

Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback

Appl. Opt. 34(19), 3793-3799 (1995)  View: HTML | PDF

Oblique laser-sheet visualization

Appl. Opt. 34(19), 3800-3805 (1995)  View: HTML | PDF

Split-screen, single-camera, laser-matrix, stereogrammetry instrument for topographical water wave measurements

Appl. Opt. 34(19), 3806-3809 (1995)  View: HTML | PDF

Quantitative rainbow schlieren deflectometry

Appl. Opt. 34(19), 3810-3825 (1995)  View: HTML | PDF

Temperature-compensated fiber specklegram strain sensing with an adaptive joint transform correlator

Appl. Opt. 34(19), 3823-3825 (1995)  View: HTML | PDF

Photon migration in the presence of a single defect: a perturbation analysis

Appl. Opt. 34(19), 3826-3837 (1995)  View: HTML | PDF

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