Abstract

The design and construction of a reflectometer for use in the infrared are described. The properties of this reflectometer include the use of essentially parallel radiation and the capability of choosing the angle of incidence at the surface being investigated. The alignment and calibration procedures which were used are presented. A description of component parts such as special mirror mounts and infrared polarizers as well as type and reliability of resultant measurements are included. Sample measurements taken on evaporated beryllium films of various thicknesses are presented in graphical form.

© 1951 Optical Society of America

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