Abstract

A simple method is described for calculating the effect of thickness errors in systems of multilayer dielectric films. The results of its application to systems of low-index-high-index quarter-wave pairs are given.

© 1954 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Anodically Produced Multiple Oxide Films for Increasing the Reflectance of Evaporated Aluminum*

Georg Hass and Alan P. Bradford
J. Opt. Soc. Am. 44(10) 810-815 (1954)

Use of Multilayer Films for Surface Topography Interferometry

J. A. Belk, S. Tolansky, and D. Turnbull
J. Opt. Soc. Am. 44(1) 5-10 (1954)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (2)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (13)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription