Abstract

The optical constants of bulk materials and thin films have been conveniently determined employing an automatic curve-fitting procedure to obtain a classical oscillator fit to reflectance and/or transmittance data. The method compares favorably in convenience and accuracy with a Kramers–Kronig analysis of bulk reflectivity spectra and is a better technique than the R,T or T,T methods presently used to analyze spectro-photometric data of thin films.

© 1968 Optical Society of America

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Figures (12)

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Equations (23)

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