Abstract

Detective quantum efficiency provides a useful measure of the imaging efficiency of imaging systems. Methods for measuring the exposure and the spatial-frequency dependence of the contrast transfer function, the noise power spectrum, and the detective quantum efficiency are developed for x-ray imaging systems. These are applied to a high-resolution screen–film combination exposed to a 30-kV-peak x-ray spectrum. The major component sources of screen–film noise in this system are identified and quantified. These are interpreted in terms of a simple model to predict the screen–film noise power spectrum and detective quantum efficiency. Reasonable agreement is found between model predictions and experimental measurements.

© 1987 Optical Society of America

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