Abstract

The full-wave approach is used to interpret the recently observed depolarization and enhanced backscattering of light from random rough surfaces fabricated in photoresist with an aluminum overcoating [ E. R. Mendez and K. A. O’Donnell, Opt. Commun. 61, 91 ( 1987); K. A. O’Donnell and E. R. Mendez, J. Opt. Soc. Am. A 4, 1194 ( 1987)]. A second-order iterative solution based on the rigorous full-wave approach indicates that, contrary to the suggestions made by Mendez and O’Donnell (who performed the experiments and considered numerous other theories), the observed enhanced backscatter is a first-order effect that can be attributed to single scatter rather than to multiple scatter.

© 1989 Optical Society of America

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