Abstract

We demonstrate the behavior of three-dimensional (3D) atom localization in a four-level Y-type atomic system driven by a microwave field. The position information of the atom can be obtained by measuring the position-dependent probe absorption when the atom interacts with three orthogonal standing-wave fields. It is found that the precision of the atom localization depends sensitively on the probe detuning and the strength of the microwave field. Remarkably, the localization precision can be significantly improved by increasing the amplitude of the microwave field, and the localization position will be changed by adjusting the relative phase between the standing-wave, microwave, and control fields.

© 2017 Optical Society of America

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