Abstract

We theoretically propose a multilayered polar-dielectric superlens system capable of sub-diffraction limited imaging simultaneously at different wavelengths. Our theory and simulation results show that this multilayered lens can fulfill a superlensing condition at multiple different wavelengths due to phonon resonances of polar dielectrics, and the number of superlensing wavelengths of the lens can be easily tuned by controlling the number of polar dielectrics. Ideally, by suitably choosing polar dielectrics, our lens can cover wavelengths ranging from infrared to THz frequencies.

©2012 Optical Society of America

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References

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  1. R. A. Shelby, D. R. Smith, and S. Schultz, “Experimental verification of a negative index of refraction,” Science 292(5514), 77–79 (2001).
    [Crossref] [PubMed]
  2. V. M. Shalaev, “Optical negative-index metamaterials,” Nat. Photonics 1(1), 41–48 (2007).
    [Crossref]
  3. D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
    [Crossref] [PubMed]
  4. J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
    [Crossref] [PubMed]
  5. H. Chen, C. T. Chan, and P. Sheng, “Transformation optics and metamaterials,” Nat. Mater. 9(5), 387–396 (2010).
    [Crossref] [PubMed]
  6. U. Leonhardt, “Optical conformal mapping,” Science 312(5781), 1777–1780 (2006).
    [Crossref] [PubMed]
  7. J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85(18), 3966–3969 (2000).
    [Crossref] [PubMed]
  8. N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
    [Crossref] [PubMed]
  9. D. Korobkin, Y. A. Urzhumov, and G. Shvets, “Far-field detection of the superlensing effect in mid-infrared: theory and experiment,” J. Mod. Opt. 52(16), 2351–2364 (2005).
    [Crossref]
  10. T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
    [Crossref] [PubMed]
  11. S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
    [Crossref] [PubMed]
  12. S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
    [Crossref]
  13. B. Knoll and F. Keilmann, “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399(6732), 134–137 (1999).
    [Crossref]
  14. R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light matter interaction at the nanometre scale,” Nature 418(6894), 159–162 (2002).
    [Crossref] [PubMed]
  15. T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy,” Appl. Phys. Lett. 85(21), 5064–5066 (2004).
    [Crossref]
  16. T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy,” Opt. Express 13(22), 8893–8899 (2005).
    [Crossref] [PubMed]
  17. A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
    [Crossref] [PubMed]
  18. A. Boltasseva and H. A. Atwater, “Materials science. Low-loss plasmonic metamaterials,” Science 331(6015), 290–291 (2011).
    [Crossref] [PubMed]
  19. Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
    [Crossref] [PubMed]
  20. A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
    [Crossref] [PubMed]
  21. P. A. Belov, C. R. Simovski, and P. Ikonen, “Canalization of subwavelength images by electromagnetic crystals,” Phys. Rev. B 71(19), 193105 (2005).
    [Crossref]
  22. B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74(11), 115116 (2006).
    [Crossref]
  23. X. Li, S. He, and Y. Jin, “Subwavelength focusing with a multilayered Fabry-Perot structure at optical frequencies,” Phys. Rev. B 75(4), 045103 (2007).
    [Crossref]
  24. E. D. Palik, Handbook of Optical Constants of Solids (Academic Press, New York, 1985).
  25. J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
    [Crossref] [PubMed]
  26. M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
    [Crossref] [PubMed]

2011 (3)

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

A. Boltasseva and H. A. Atwater, “Materials science. Low-loss plasmonic metamaterials,” Science 331(6015), 290–291 (2011).
[Crossref] [PubMed]

2010 (2)

H. Chen, C. T. Chan, and P. Sheng, “Transformation optics and metamaterials,” Nat. Mater. 9(5), 387–396 (2010).
[Crossref] [PubMed]

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

2009 (1)

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

2008 (1)

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

2007 (4)

X. Li, S. He, and Y. Jin, “Subwavelength focusing with a multilayered Fabry-Perot structure at optical frequencies,” Phys. Rev. B 75(4), 045103 (2007).
[Crossref]

V. M. Shalaev, “Optical negative-index metamaterials,” Nat. Photonics 1(1), 41–48 (2007).
[Crossref]

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

2006 (5)

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

U. Leonhardt, “Optical conformal mapping,” Science 312(5781), 1777–1780 (2006).
[Crossref] [PubMed]

M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
[Crossref] [PubMed]

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74(11), 115116 (2006).
[Crossref]

2005 (4)

T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy,” Opt. Express 13(22), 8893–8899 (2005).
[Crossref] [PubMed]

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
[Crossref] [PubMed]

D. Korobkin, Y. A. Urzhumov, and G. Shvets, “Far-field detection of the superlensing effect in mid-infrared: theory and experiment,” J. Mod. Opt. 52(16), 2351–2364 (2005).
[Crossref]

P. A. Belov, C. R. Simovski, and P. Ikonen, “Canalization of subwavelength images by electromagnetic crystals,” Phys. Rev. B 71(19), 193105 (2005).
[Crossref]

2004 (1)

T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy,” Appl. Phys. Lett. 85(21), 5064–5066 (2004).
[Crossref]

2002 (1)

R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light matter interaction at the nanometre scale,” Nature 418(6894), 159–162 (2002).
[Crossref] [PubMed]

2001 (1)

R. A. Shelby, D. R. Smith, and S. Schultz, “Experimental verification of a negative index of refraction,” Science 292(5514), 77–79 (2001).
[Crossref] [PubMed]

2000 (1)

J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85(18), 3966–3969 (2000).
[Crossref] [PubMed]

1999 (1)

B. Knoll and F. Keilmann, “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399(6732), 134–137 (1999).
[Crossref]

Aizpurua, J.

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

Alekseyev, L.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Algra, R. E.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

Atwater, H. A.

A. Boltasseva and H. A. Atwater, “Materials science. Low-loss plasmonic metamaterials,” Science 331(6015), 290–291 (2011).
[Crossref] [PubMed]

Bakkers, E. P. A. M.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

Bartal, G.

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

Belov, P. A.

P. A. Belov, C. R. Simovski, and P. Ikonen, “Canalization of subwavelength images by electromagnetic crystals,” Phys. Rev. B 71(19), 193105 (2005).
[Crossref]

Boltasseva, A.

A. Boltasseva and H. A. Atwater, “Materials science. Low-loss plasmonic metamaterials,” Science 331(6015), 290–291 (2011).
[Crossref] [PubMed]

Brehm, M.

M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
[Crossref] [PubMed]

Chan, C. T.

H. Chen, C. T. Chan, and P. Sheng, “Transformation optics and metamaterials,” Nat. Mater. 9(5), 387–396 (2010).
[Crossref] [PubMed]

Chen, H.

H. Chen, C. T. Chan, and P. Sheng, “Transformation optics and metamaterials,” Nat. Mater. 9(5), 387–396 (2010).
[Crossref] [PubMed]

Cummer, S. A.

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

Diedenhofen, S. L.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

Eng, L. M.

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Fang, N.

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
[Crossref] [PubMed]

Franz, K. J.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Gajek, M.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Gmachl, C.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

He, S.

X. Li, S. He, and Y. Jin, “Subwavelength focusing with a multilayered Fabry-Perot structure at optical frequencies,” Phys. Rev. B 75(4), 045103 (2007).
[Crossref]

Helm, M.

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Hillenbrand, R.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
[Crossref] [PubMed]

T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy,” Opt. Express 13(22), 8893–8899 (2005).
[Crossref] [PubMed]

T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy,” Appl. Phys. Lett. 85(21), 5064–5066 (2004).
[Crossref]

R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light matter interaction at the nanometre scale,” Nature 418(6894), 159–162 (2002).
[Crossref] [PubMed]

Hoffman, A. J.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Howard, S. S.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Huber, A. J.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

Ikonen, P.

P. A. Belov, C. R. Simovski, and P. Ikonen, “Canalization of subwavelength images by electromagnetic crystals,” Phys. Rev. B 71(19), 193105 (2005).
[Crossref]

Jacob, R.

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Jin, Y.

X. Li, S. He, and Y. Jin, “Subwavelength focusing with a multilayered Fabry-Perot structure at optical frequencies,” Phys. Rev. B 75(4), 045103 (2007).
[Crossref]

Justice, B. J.

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

Kehr, S. C.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

Keilmann, F.

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
[Crossref] [PubMed]

T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy,” Opt. Express 13(22), 8893–8899 (2005).
[Crossref] [PubMed]

T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy,” Appl. Phys. Lett. 85(21), 5064–5066 (2004).
[Crossref]

R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light matter interaction at the nanometre scale,” Nature 418(6894), 159–162 (2002).
[Crossref] [PubMed]

B. Knoll and F. Keilmann, “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399(6732), 134–137 (1999).
[Crossref]

Khan, A. I.

Knoll, B.

B. Knoll and F. Keilmann, “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399(6732), 134–137 (1999).
[Crossref]

Korobkin, D.

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

D. Korobkin, Y. A. Urzhumov, and G. Shvets, “Far-field detection of the superlensing effect in mid-infrared: theory and experiment,” J. Mod. Opt. 52(16), 2351–2364 (2005).
[Crossref]

Lee, H.

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
[Crossref] [PubMed]

Leonhardt, U.

U. Leonhardt, “Optical conformal mapping,” Science 312(5781), 1777–1780 (2006).
[Crossref] [PubMed]

Li, J.

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

Li, X.

X. Li, S. He, and Y. Jin, “Subwavelength focusing with a multilayered Fabry-Perot structure at optical frequencies,” Phys. Rev. B 75(4), 045103 (2007).
[Crossref]

Liu, Y.

Liu, Y. M.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Liu, Z.

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

Martin, L. W.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Mock, J. J.

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

Narimanov, E. E.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Parzefall, M.

Pendry, J. B.

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74(11), 115116 (2006).
[Crossref]

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85(18), 3966–3969 (2000).
[Crossref] [PubMed]

Podolskiy, V. A.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Ramesh, R.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

Rivas, J.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

Schultz, S.

R. A. Shelby, D. R. Smith, and S. Schultz, “Experimental verification of a negative index of refraction,” Science 292(5514), 77–79 (2001).
[Crossref] [PubMed]

Schurig, D.

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

Shalaev, V. M.

V. M. Shalaev, “Optical negative-index metamaterials,” Nat. Photonics 1(1), 41–48 (2007).
[Crossref]

Shelby, R. A.

R. A. Shelby, D. R. Smith, and S. Schultz, “Experimental verification of a negative index of refraction,” Science 292(5514), 77–79 (2001).
[Crossref] [PubMed]

Sheng, P.

H. Chen, C. T. Chan, and P. Sheng, “Transformation optics and metamaterials,” Nat. Mater. 9(5), 387–396 (2010).
[Crossref] [PubMed]

Shvets, G.

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

D. Korobkin, Y. A. Urzhumov, and G. Shvets, “Far-field detection of the superlensing effect in mid-infrared: theory and experiment,” J. Mod. Opt. 52(16), 2351–2364 (2005).
[Crossref]

Simovski, C. R.

P. A. Belov, C. R. Simovski, and P. Ikonen, “Canalization of subwavelength images by electromagnetic crystals,” Phys. Rev. B 71(19), 193105 (2005).
[Crossref]

Sivco, D. L.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Smith, D. R.

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

R. A. Shelby, D. R. Smith, and S. Schultz, “Experimental verification of a negative index of refraction,” Science 292(5514), 77–79 (2001).
[Crossref] [PubMed]

Starr, A. F.

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

Stiegler, J. M.

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

Sun, C.

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
[Crossref] [PubMed]

Taubner, T.

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
[Crossref] [PubMed]

T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy,” Opt. Express 13(22), 8893–8899 (2005).
[Crossref] [PubMed]

T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy,” Appl. Phys. Lett. 85(21), 5064–5066 (2004).
[Crossref]

R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light matter interaction at the nanometre scale,” Nature 418(6894), 159–162 (2002).
[Crossref] [PubMed]

Tsai, D. P.

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74(11), 115116 (2006).
[Crossref]

Urzhumov, Y.

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

Urzhumov, Y. A.

D. Korobkin, Y. A. Urzhumov, and G. Shvets, “Far-field detection of the superlensing effect in mid-infrared: theory and experiment,” J. Mod. Opt. 52(16), 2351–2364 (2005).
[Crossref]

Valentine, J.

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

von Ribbeck, H.-G.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

Wasserman, D.

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Wenzel, M. T.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

Wittborn, J.

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

Wood, B.

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74(11), 115116 (2006).
[Crossref]

Xiong, Y.

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

Yang, C.-H.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Yang, S.-Y.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Yu, P.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

Zentgraf, T.

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

Zhang, X.

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

S. C. Kehr, P. Yu, Y. Liu, M. Parzefall, A. I. Khan, R. Jacob, M. T. Wenzel, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Microspectroscopy on perovskite-based superlenses,” Opt. Mater. Express 1(5), 1051–1060 (2011).
[Crossref]

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
[Crossref] [PubMed]

Appl. Phys. Lett. (1)

T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy,” Appl. Phys. Lett. 85(21), 5064–5066 (2004).
[Crossref]

J. Mod. Opt. (1)

D. Korobkin, Y. A. Urzhumov, and G. Shvets, “Far-field detection of the superlensing effect in mid-infrared: theory and experiment,” J. Mod. Opt. 52(16), 2351–2364 (2005).
[Crossref]

Nano Lett. (3)

A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices,” Nano Lett. 8(11), 3766–3770 (2008).
[Crossref] [PubMed]

J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenbrand, “Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy,” Nano Lett. 10(4), 1387–1392 (2010).
[Crossref] [PubMed]

M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Lett. 6(7), 1307–1310 (2006).
[Crossref] [PubMed]

Nat. Commun. (1)

S. C. Kehr, Y. M. Liu, L. W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M. T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L. M. Eng, and R. Ramesh, “Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling,” Nat. Commun. 2, 249 (2011).
[Crossref] [PubMed]

Nat. Mater. (3)

J. Valentine, J. Li, T. Zentgraf, G. Bartal, and X. Zhang, “An optical cloak made of dielectrics,” Nat. Mater. 8(7), 568–571 (2009).
[Crossref] [PubMed]

H. Chen, C. T. Chan, and P. Sheng, “Transformation optics and metamaterials,” Nat. Mater. 9(5), 387–396 (2010).
[Crossref] [PubMed]

A. J. Hoffman, L. Alekseyev, S. S. Howard, K. J. Franz, D. Wasserman, V. A. Podolskiy, E. E. Narimanov, D. L. Sivco, and C. Gmachl, “Negative refraction in semiconductor metamaterials,” Nat. Mater. 6(12), 946–950 (2007).
[Crossref] [PubMed]

Nat. Photonics (1)

V. M. Shalaev, “Optical negative-index metamaterials,” Nat. Photonics 1(1), 41–48 (2007).
[Crossref]

Nature (2)

B. Knoll and F. Keilmann, “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399(6732), 134–137 (1999).
[Crossref]

R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light matter interaction at the nanometre scale,” Nature 418(6894), 159–162 (2002).
[Crossref] [PubMed]

Opt. Express (1)

Opt. Mater. Express (1)

Phys. Rev. B (3)

P. A. Belov, C. R. Simovski, and P. Ikonen, “Canalization of subwavelength images by electromagnetic crystals,” Phys. Rev. B 71(19), 193105 (2005).
[Crossref]

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74(11), 115116 (2006).
[Crossref]

X. Li, S. He, and Y. Jin, “Subwavelength focusing with a multilayered Fabry-Perot structure at optical frequencies,” Phys. Rev. B 75(4), 045103 (2007).
[Crossref]

Phys. Rev. Lett. (1)

J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85(18), 3966–3969 (2000).
[Crossref] [PubMed]

Science (7)

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308(5721), 534–537 (2005).
[Crossref] [PubMed]

T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, “Near-field microscopy through a SiC superlens,” Science 313(5793), 1595 (2006).
[Crossref] [PubMed]

D. Schurig, J. J. Mock, B. J. Justice, S. A. Cummer, J. B. Pendry, A. F. Starr, and D. R. Smith, “Metamaterial electromagnetic cloak at microwave frequencies,” Science 314(5801), 977–980 (2006).
[Crossref] [PubMed]

U. Leonhardt, “Optical conformal mapping,” Science 312(5781), 1777–1780 (2006).
[Crossref] [PubMed]

A. Boltasseva and H. A. Atwater, “Materials science. Low-loss plasmonic metamaterials,” Science 331(6015), 290–291 (2011).
[Crossref] [PubMed]

Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, “Far-field optical hyperlens magnifying sub-diffraction-limited objects,” Science 315(5819), 1686 (2007).
[Crossref] [PubMed]

R. A. Shelby, D. R. Smith, and S. Schultz, “Experimental verification of a negative index of refraction,” Science 292(5514), 77–79 (2001).
[Crossref] [PubMed]

Other (1)

E. D. Palik, Handbook of Optical Constants of Solids (Academic Press, New York, 1985).

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Figures (7)

Fig. 1
Fig. 1 Schematic diagram of a MW superlens with two different polar dielectrics. Depending on the illumination wavelength, the permittivity of the used polar dielectric changes its sign.

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Fig. 2
Fig. 2 Real parts (solid lines) and imaginary parts (dashed lines) of dielectric permittivities of SiC, InP and InSb. Black dotted lines indicate the matched wavelengths of SiC-InSb system.

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Fig. 3
Fig. 3 (Top) simulated distribution of magnetic fields for the SiC-InSb lens at two different operation wavelengths (a) λ1 = 11.7 μm and (b) λ2 = 53.7 μm. (Bottom) simulated electric field intensity through a 500 nm width double slit with 1 μm separation at the image plane behind the lens.

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Fig. 4
Fig. 4 Variation of the transmittance (log10[|T|2]) of the SiC-InSb superlens as a function of kx and the wavelength λ.

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Fig. 5
Fig. 5 1/Re(åeff,z) of the InSb-InP-SiC system. The three arrows indicate the multilayered superlensing conditions.

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Fig. 6
Fig. 6 Distribution of the total electric field intensity for a 6-layered InSb-InP-SiC lens at three different wavelengths: (a) λ = 11.2 μm, (b) λ = 30.4 μm and (c) λ = 53.3 μm.

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Fig. 7
Fig. 7 Infrared s-SNOM amplitude s2 of n-doped InAs for three different doping concentrations. Gray bars correspond to three covered ranges of the InSb-InP-SiC superlens.

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Tables (1)

Tables Icon

Table 1 Covered Range by Changing the Ratio f from 0.2 to 0.8

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Equations (2)

Equations on this page are rendered with MathJax. Learn more.

ε x = ε y = ε 1 d 1 + ε 2 d 2 d 1 + d 2 , ε z = ( ε 1 −1 d 1 + ε 2 −1 d 2 d 1 + d 2 ) −1
ε x = ε y = ∑ i ε i d i /D, ε z = ( ∑ i ε i −1 d i /D ) −1

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